1117 search results - page 18 / 224 » Improving Testing Efficiency using Cumulative Test Analysis |
CEJCS
2011
12 years 7 months ago
2011
: Effective validation of distributed real-time and embedded (DRE) system quality-of-service (QoS) properties (e.g., event prioritization, latency, and throughput) requires testin...
ATS
2000
IEEE
13 years 12 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
ICSE
2007
IEEE-ACM
14 years 1 months ago
2007
IEEE-ACM
Recently, tools for the analysis and visualization of code coverage have become widely available. At first glance, their value in assessing and improving the quality of automated ...
ICS
1994
Tsinghua U.
13 years 11 months ago
1994
Tsinghua U.
We present a parallel code generation algorithm for complete applications and a new experimental methodology that tests the efficacy of our approach. The algorithm optimizes for d...
DDECS
2006
IEEE
14 years 1 months ago
2006
IEEE
: An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the R...