1117 search results - page 25 / 224 » Improving Testing Efficiency using Cumulative Test Analysis |
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
SIGADA
2001
Springer
13 years 12 months ago
2001
Springer
Automatic software testing is gradually becoming accepted practice in the software industry. The shrinking development cycle and higher expectation of software quality are forcing...
DATE
2003
IEEE
14 years 25 days ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
ENGL
2007
13 years 7 months ago
2007
— Using computer simulated tests, this study examined direction-of-motion stereotypes and response times for different configurations of lever controls and circular displays. Qua...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...