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ECCV
2008
Springer
14 years 11 months ago
A Linear Time Histogram Metric for Improved SIFT Matching
We present a new metric between histograms such as SIFT descriptors and a linear time algorithm for its computation. It is common practice to use the L2 metric for comparing SIFT d...
Ofir Pele, Michael Werman
IPMI
2003
Springer
14 years 10 months ago
Improving Appearance Model Matching Using Local Image Structure
I. M. Scott, Timothy F. Cootes, Christopher J. Tay...
SIGMOD
2008
ACM
124views Database» more  SIGMOD 2008»
14 years 10 months ago
Improving suffix array locality for fast pattern matching on disk
Ranjan Sinha, Simon J. Puglisi, Alistair Moffat, A...
ICPR
2008
IEEE
14 years 4 months ago
Improving efficiency of fingerprint matching by minutiae indexing
Yangyang Zhang, Jie Tian, Kai Cao, Peng Li, Xin Ya...