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CARDIS
2010
Springer
187views Hardware» more  CARDIS 2010»
14 years 4 months ago
Improved Fault Analysis of Signature Schemes
At ACISP 2004, Giraud and Knudsen presented the first fault analysis of DSA, ECDSA, XTR-DSA, Schnorr and ElGamal signatures schemes that considered faults affecting one byte. The...
Christophe Giraud, Erik Woodward Knudsen, Michael ...
ASPDAC
2005
ACM
92views Hardware» more  ASPDAC 2005»
14 years 3 months ago
Detailed placement for improved depth of focus and CD control
— Sub-resolution assist features (SRAFs) provide an absolutely essential technique for critical dimension (CD) control and process window enhancement in subwavelength lithography...
Puneet Gupta, Andrew B. Kahng, Chul-Hong Park
MSR
2005
ACM
14 years 3 months ago
Repository mining and Six Sigma for process improvement
In this paper, we propose to apply artifact mining in a global development environment to support measurement based process management and improvement, such as SEI/CMMI’s GQ(I)M...
Michael VanHilst, Pankaj K. Garg, Christopher Lo
METRICS
2003
IEEE
14 years 3 months ago
Measuring and Improving Design Patterns Testability
This paper addresses not only the question of testability measurement of OO designs but also focuses on its practicability. While detecting testability weaknesses (called testabil...
Benoit Baudry, Yves Le Traon, Gerson Sunyé,...
GECCO
2009
Springer
126views Optimization» more  GECCO 2009»
14 years 2 months ago
Improving NSGA-II with an adaptive mutation operator
The performance of a Multiobjective Evolutionary Algorithm (MOEA) is crucially dependent on the parameter setting of the operators. The most desired control of such parameters pre...
Arthur Gonçalves Carvalho, Aluizio F. R. Ar...