At ACISP 2004, Giraud and Knudsen presented the first fault analysis of DSA, ECDSA, XTR-DSA, Schnorr and ElGamal signatures schemes that considered faults affecting one byte. The...
Christophe Giraud, Erik Woodward Knudsen, Michael ...
— Sub-resolution assist features (SRAFs) provide an absolutely essential technique for critical dimension (CD) control and process window enhancement in subwavelength lithography...
In this paper, we propose to apply artifact mining in a global development environment to support measurement based process management and improvement, such as SEI/CMMI’s GQ(I)M...
This paper addresses not only the question of testability measurement of OO designs but also focuses on its practicability. While detecting testability weaknesses (called testabil...
The performance of a Multiobjective Evolutionary Algorithm (MOEA) is crucially dependent on the parameter setting of the operators. The most desired control of such parameters pre...