Discrete-event simulation is widely used to analyse and improve the performance of manufacturing systems. The related optimization problem often includes integer design variables ...
S. J. Abspoel, L. F. P. Etman, J. Vervoort, J. E. ...
—This paper describes a new technique, which automatically selects the most appropriate developers for fixing the fault represented by a failing test case, and provides a diagno...
ir increasing use of abstraction, modularity, delayed binding, polymorphism, and source reuse, especially when these attributes are used in combination. Modern processor architectu...
Hemant G. Rotithor, Kevin W. Harris, Mark W. Davis
—Mutation testing measures the adequacy of a test suite by seeding artificial defects (mutations) into a program. If a test suite fails to detect a mutation, it may also fail to...
Metadata IR model has high precision and low recall because the query in Metadata IR model is strict that is, the query can express user information need exactly, while Full-text I...