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SDL
2007
152views Hardware» more  SDL 2007»
13 years 9 months ago
TTCN-3 Quality Engineering: Using Learning Techniques to Evaluate Metric Sets
Software metrics are an essential means to assess software quality. For the assessment of software quality, typically sets of complementing metrics are used since individual metric...
Edith Werner, Jens Grabowski, Helmut Neukirchen, N...
ECCV
2008
Springer
14 years 9 months ago
Output Regularized Metric Learning with Side Information
Distance metric learning has been widely investigated in machine learning and information retrieval. In this paper, we study a particular content-based image retrieval application ...
Wei Liu, Steven C. H. Hoi, Jianzhuang Liu
CVPR
2007
IEEE
14 years 9 months ago
Adaptive Distance Metric Learning for Clustering
A good distance metric is crucial for unsupervised learning from high-dimensional data. To learn a metric without any constraint or class label information, most unsupervised metr...
Jieping Ye, Zheng Zhao, Huan Liu
PR
2006
76views more  PR 2006»
13 years 7 months ago
Extending the relevant component analysis algorithm for metric learning using both positive and negative equivalence constraints
Relevant component analysis (RCA) is a recently proposed metric learning method for semi-supervised learning applications. It is a simple and efficient method that has been applie...
Dit-Yan Yeung, Hong Chang
ACL
2010
13 years 5 months ago
Learning Better Data Representation Using Inference-Driven Metric Learning
We initiate a study comparing effectiveness of the transformed spaces learned by recently proposed supervised, and semisupervised metric learning algorithms to those generated by ...
Paramveer S. Dhillon, Partha Pratim Talukdar, Koby...