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» Information-theoretic metric learning

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ENTCS
2010

111views more ENTCS 2010»

Fundamental Nano-Patterns to Characterize and Classify Java Methods

13 years 5 months ago

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Fundamental nano-patterns are simple, static, binary properties of Java methods, such as ObjectCreator and Recursive. We present a provisional catalogue of 17 such nano-patterns. ...

Jeremy Singer, Gavin Brown, Mikel Luján, Ad...

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ICMLC
2005
Springer

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Kernel-Based Metric Adaptation with Pairwise Constraints

14 years 1 months ago

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Abstract. Many supervised and unsupervised learning algorithms depend on the choice of an appropriate distance metric. While metric learning for supervised learning tasks has a lon...

Hong Chang, Dit-Yan Yeung

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ICIP
2008
IEEE

191views Image Processing» more ICIP 2008»

Unifying analysis of full reference image quality assessment

14 years 9 months ago

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This paper studies two increasingly popular paradigms for image quality assessment - Structural SIMilarity (SSIM) metrics and Information Fidelity metrics. The relation of the SSI...

Kalpana Seshadrinathan, Alan C. Bovik

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ICML
2003
IEEE

142views Machine Learning» more ICML 2003»

The Geometry of ROC Space: Understanding Machine Learning Metrics through ROC Isometrics

14 years 8 months ago