332 search results - page 17 / 67 » Instrumentality Tests Revisited |
ECAI
2000
Springer
13 years 12 months ago
2000
Springer
Abstract. This paper describes an experimental comparison between two standard supervised learning methods, namely Naive Bayes and Exemplar–basedclassification, on the Word Sens...
AUSAI
2008
Springer
13 years 9 months ago
2008
Springer
Multiple-Instance Learning via Embedded Instance Selection (MILES) is a recently proposed multiple-instance (MI) classification algorithm that applies a single-instance base learne...
ECBS
2011
IEEE
12 years 7 months ago
2011
IEEE
Abstract—Software systems are typically large and exhaustive testing of all possible input parameters is usually not feasible. Testers select tests that they anticipate may catch...
HICSS
2007
IEEE
14 years 2 months ago
2007
IEEE
This paper presents a test framework to support unit component testing in distributed component-based systems that are built upon component technologies like CORBA, COM/.NET, J2EE...
TE
2010
13 years 2 months ago
2010
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...