1598 search results - page 21 / 320 » Integrating Component Tests to System Tests |
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
TAICPART
2010
IEEE
13 years 5 months ago
2010
IEEE
We report on how the Wrangler refactoring tool has been used to improve and transform test code for Erlang systems. This has been achieved through the removal of code clones, the i...
ICTAC
2009
Springer
13 years 5 months ago
2009
Springer
Testing from first-order specifications has mainly been studied for flat specifications, that are specifications of a single software module. However, the specifications of large s...
GECCO
2006
Springer
13 years 11 months ago
2006
Springer
Achieving a high quality and cost-effective tests is a major concern for software buyers and sellers. Using tools and integrating techniques to carry out low cost testing are chal...
SMA
2010
ACM
13 years 7 months ago
2010
ACM
We present an algorithm which robustly computes the intersection curve(s) of an under-constrained piecewise polynomial system consisting of n equations with n + 1 unknowns. The so...