Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley,...
We explore the relationship between properties of the network defined by connected agents and the global system performance. This is achieved by means of a novel class of optimiza...
Link spam deliberately manipulates hyperlinks between web pages in order to unduly boost the search engine ranking of one or more target pages. Link based ranking algorithms such ...
We present a region-based active contour detection algorithm for objects that exhibit relatively homogeneous photometric characteristics (e.g. smooth color or gray levels), embedd...
Stefano Soatto, Ganesh Sundaramoorthi, Anthony Yez...
The advent of affordable, shared-nothing computing systems portends a new class of parallel database management systems (DBMS) for on-line transaction processing (OLTP) applicatio...