In order to facilitate incremental modeling and analysis of fault-tolerant embedded systems, we introduce an object analysis pattern, called the detector pattern, that provides a ...
Abstract. Two methods have been identified for Event-B model decomposition: shared variable and shared event. The purpose of this paper is to introduce the two approaches and the ...
Renato Silva, Carine Pascal, Thai Son Hoang, Micha...
TLM (Transaction-Level Modeling) was introduced to cope with the increasing complexity of Systems-on-Chip designs by raising the modeling level. Currently, TLM is primarily used fo...
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
Most complex systems today contain software, and systems failures activated by software faults can provide lessons for software development practices and software quality assuranc...