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» Introducing the Next Generation of Software Inspection Tools
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IOLTS
2000
IEEE
105views Hardware» more  IOLTS 2000»
13 years 12 months ago
Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
Patrick Girard, Christian Landrault, Serge Pravoss...
COOPIS
2004
IEEE
13 years 11 months ago
TRAP/J: Transparent Generation of Adaptable Java Programs
This paper describes TRAP/J, a software tool that enables new adaptable behavior to be added to existing Java applications transparently (that is, without modifying the application...
Seyed Masoud Sadjadi, Philip K. McKinley, Betty H....
APSEC
2004
IEEE
13 years 11 months ago
Reasoning about Semantic Web in Isabelle/HOL
Semantic Web is regarded as the next generation of the World Wide Web. It provides not only the structure of the web but also meaningful semantics for the information presented. T...
Yue Tang, Jin Song Dong, Jing Sun, Brendan P. Maho...
APSEC
2000
IEEE
13 years 12 months ago
Transatlantic project courses in a university environment
Communication and collaboration is difficult in geographically distributed settings. As a result of globalization, merges and acquisition, and scarce skills, software development...
Bernd Brügge, Allen H. Dutoit, Rafael Kobylin...
KBSE
2010
IEEE
13 years 5 months ago
Test generation to expose changes in evolving programs
Software constantly undergoes changes throughout its life cycle, and thereby it evolves. As changes are introduced into a code base, we need to make sure that the effect of the ch...
Dawei Qi, Abhik Roychoudhury, Zhenkai Liang