As the minimum feature sizes of VLSI circuits get smaller while the clock frequency increases, the effects of process variations become significant. We propose a UST/DME based ap...
Abstract--We present a novel and efficient algorithm, PATH COVERING, for solving the most reliable subgraph problem. A reliable subgraph gives a concise summary of the connectivity...
—The methodologies to calculate failure probability and to estimate the reliability of fatigue loaded structures are developed. The applicability of the methodologies is evaluate...
A feedback scheme for preparation of photon number states in a microwave cavity is proposed. Quantum Non Demolition (QND) measurement of the cavity field provides information on it...
We present Risk Integrated's Enterprise Spreadsheet Platform (ESP), a technical approach to the near-elimination of spreadsheet risk in the enterprise computing environment, ...