Abstract-- In this paper, a necessary and sufficient condition for sampling in the general framework of shift invariant spaces is derived. Then this result is applied respectively ...
Let V (φ) be a shift invariant subspace of L2 (R) generated by a Riesz or frame generator φ(t) in L2 (R). We assume that φ(t) is suitably chosen so that V (φ) becomes a reprod...
The SIFT (Scale Invariant Feature Transform) descriptor is a widely used method for matching image features. However, perfect scale invariance can not be achieved in practice becau...
An irregular wavelet frame has the form W(ψ, Λ) = {a−1/2 ψ(x a − b)}(a,b)∈Λ, where ψ ∈ L2 (R) and Λ is an arbitrary sequence of points in the affine group A = R+ × ...
Let V () be a shift invariant subspace of L2 (R) generated by a Riesz or frame generator (t) in L2 (R). We assume that (t) is suitably chosen so that the regular sampling expansio...