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» Learning bilinear models for two-factor problems in vision
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CVPR
2009
IEEE
15 years 4 months ago
Higher-Order Clique Reduction in Binary Graph Cut
We introduce a new technique that can reduce any higher-order Markov random field with binary labels into a first-order one that has the same minima as the original. Moreover, w...
Hiroshi Ishikawa 0002
TIP
2010
155views more  TIP 2010»
13 years 7 months ago
Laplacian Regularized D-Optimal Design for Active Learning and Its Application to Image Retrieval
—In increasingly many cases of interest in computer vision and pattern recognition, one is often confronted with the situation where data size is very large. Usually, the labels ...
Xiaofei He
MLG
2007
Springer
14 years 3 months ago
Learning Graph Matching
As a fundamental problem in pattern recognition, graph matching has found a variety of applications in the field of computer vision. In graph matching, patterns are modeled as gr...
Alex J. Smola
CVPR
2011
IEEE
13 years 5 months ago
A Deformation and Lighting Insensitive Metric for Face Recognition
Face recognition is a challenging problem, complicated by variations in pose, expression, lighting, and the passage of time. Significant work has been done to solve each of these...
Anne Jorstad, David Jacobs, Alain Trouvé
CVPR
2005
IEEE
14 years 11 months ago
Semi-Supervised Adapted HMMs for Unusual Event Detection
We address the problem of temporal unusual event detection. Unusual events are characterized by a number of features (rarity, unexpectedness, and relevance) that limit the applica...
Dong Zhang, Daniel Gatica-Perez, Samy Bengio, Iain...