6715 search results - page 30 / 1343 » Learning from a Test Set |
GLVLSI
2002
IEEE
14 years 1 months ago
2002
IEEE
We present a novel test scheduling algorithm for embedded corebased SoC’s. Given a system integrated with a set of cores and a set of test resources, we select a test for each c...
ICNC
2005
Springer
14 years 2 months ago
2005
Springer
The DARPA/MIT Lincoln Laboratory off-line intrusion detection evaluation data set is the most widely used public benchmark for testing intrusion detection systems. But the presence...
KDD
2003
ACM
14 years 8 months ago
2003
ACM
Classification is a well-established operation in text mining. Given a set of labels A and a set DA of training documents tagged with these labels, a classifier learns to assign l...
FGR
2008
IEEE
14 years 2 months ago
2008
IEEE
Partial occlusions in face images pose a great problem for most face recognition algorithms. Several solutions to this problem have been proposed over the years – ranging from d...
MTV
2005
IEEE
14 years 2 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...