4660 search results - page 770 / 932 » Learning from imperfect data |
ATAL
2009
Springer
14 years 3 months ago
2009
Springer
Sensor nodes are often used to collect data from locations inaccessible or hazardous for humans. As they are not under normal supervision, these nodes are particularly susceptible...
KDD
2004
ACM
14 years 2 months ago
2004
ACM
Part numbers are widely used within an enterprise throughout the manufacturing process. The point of entry of such part numbers into this process is normally via a Bill of Materia...
BMCBI
2010
13 years 6 months ago
2010
Background: To exploit the flood of data from advances in high throughput imaging of optically sectioned nuclei, image analysis methods need to correctly detect thousands of nucle...
CVPR
2006
IEEE
14 years 11 months ago
2006
IEEE
Although it has been studied for several years by computer vision and machine learning communities, image annotation is still far from practical. In this paper, we present AnnoSea...
CVPR
2008
IEEE
14 years 11 months ago
2008
IEEE
This paper proposes a new concept in hierarchical representations that exploits features of different granularity and specificity coming from all layers of the hierarchy. The conc...