In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Local search is a powerful and well-established method for solving hard combinatorial problems. Yet, until recently, it has provided very little user support, leading to time-consu...
We present an extension of the planning framework based on action graphs and local search to deal with PDDL2.1 temporal problems requiring concurrency, while previously the approa...
The problem of finding a local minimum of a black-box function is central for understanding local search as well as quantum adiabatic algorithms. For functions on the Boolean hype...
We consider the problem of storing an ordered dictionary data structure over a distributed set of nodes. In contrast to traditional sequential data structures, distributed data st...