This paper presents a unique approach to improve yield given a routed layout. Currently after routing has been completed and compacted, it generally proceeds to verification witho...
The development of the XCS Learning Classifier System [26] has produced a stable implementation, able to consistently identify the accurate and optimally general population of cla...
The recent demand for system-on-chip RF mixed-signal design and aggressive supply-voltage reduction require chip-level accurate analysis of both the substrate and power delivery s...
Tsung-Hao Chen, Clement Luk, Charlie Chung-Ping Ch...
AI and connectionist approaches to learning from examples differ in knowledge-base representation and inductive mechanisms. To explore these differences we experiment with a syste...
The impact of test conditions on the detectability of open defects is investigated. We performed an inductive fault analysis on representative standard gates. The simulation resul...