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ICCAD
1997
IEEE
134views Hardware» more  ICCAD 1997»
14 years 2 months ago
Post-route optimization for improved yield using a rubber-band wiring model
This paper presents a unique approach to improve yield given a routed layout. Currently after routing has been completed and compacted, it generally proceeds to verification witho...
Jeffrey Z. Su, Wayne Wei-Ming Dai
GECCO
2003
Springer
112views Optimization» more  GECCO 2003»
14 years 3 months ago
Limits in Long Path Learning with XCS
The development of the XCS Learning Classifier System [26] has produced a stable implementation, able to consistently identify the accurate and optimally general population of cla...
Alwyn Barry
ICCAD
2003
IEEE
142views Hardware» more  ICCAD 2003»
14 years 6 months ago
SuPREME: Substrate and Power-delivery Reluctance-Enhanced Macromodel Evaluation
The recent demand for system-on-chip RF mixed-signal design and aggressive supply-voltage reduction require chip-level accurate analysis of both the substrate and power delivery s...
Tsung-Hao Chen, Clement Luk, Charlie Chung-Ping Ch...
IJCAI
1989
13 years 11 months ago
An Empirical Comparison of ID3 and Back-propagation
AI and connectionist approaches to learning from examples differ in knowledge-base representation and inductive mechanisms. To explore these differences we experiment with a syste...
Douglas H. Fisher, Kathleen B. McKusick
DATE
2006
IEEE
66views Hardware» more  DATE 2006»
14 years 3 months ago
On test conditions for the detection of open defects
The impact of test conditions on the detectability of open defects is investigated. We performed an inductive fault analysis on representative standard gates. The simulation resul...
Bram Kruseman, Manuel Heiligers