130 search results - page 11 / 26 » Line Decomposition Based on Critical Points Detection |
TCAD
2010
13 years 2 months ago
2010
Abstract--In double patterning lithography (DPL) layout decomposition for 45nm and below process nodes, two features must be assigned opposite colors (corresponding to different ex...
ICIP
2007
IEEE
14 years 1 months ago
2007
IEEE
Corner detection plays an important role in object recognition and motion analysis. In this paper, we propose a hierarchical corner detection framework based on spectral clusterin...
ROBOCUP
2007
Springer
14 years 1 months ago
2007
Springer
In this article we present an automatic on-line color calibration system that makes extensive use of the spatial relationships between color classes in the color space. First, we i...
FIMH
2005
Springer
14 years 1 months ago
2005
Springer
Plaque analysis in IVUS planes needs accurate intima and adventitia models. Large variety in adventitia descriptors difficulties its detection and motivates using a classification...
ICPR
2004
IEEE
14 years 8 months ago
2004
IEEE
A support vector machine based algorithm for corner detection is presented. It is based on computing the direction of maximum gray-level change for each edge pixel in an image, an...