130 search results - page 11 / 26 » Line Decomposition Based on Critical Points Detection |
184
Voted
TCAD
2010
14 years 10 months ago
2010
Abstract--In double patterning lithography (DPL) layout decomposition for 45nm and below process nodes, two features must be assigned opposite colors (corresponding to different ex...
136
Voted
ICIP
2007
IEEE
15 years 10 months ago
2007
IEEE
Corner detection plays an important role in object recognition and motion analysis. In this paper, we propose a hierarchical corner detection framework based on spectral clusterin...
155
Voted
ROBOCUP
2007
Springer
15 years 9 months ago
2007
Springer
In this article we present an automatic on-line color calibration system that makes extensive use of the spatial relationships between color classes in the color space. First, we i...
149
Voted
FIMH
2005
Springer
15 years 9 months ago
2005
Springer
Plaque analysis in IVUS planes needs accurate intima and adventitia models. Large variety in adventitia descriptors difficulties its detection and motivates using a classification...
129
Voted
ICPR
2004
IEEE
16 years 4 months ago
2004
IEEE
A support vector machine based algorithm for corner detection is presented. It is based on computing the direction of maximum gray-level change for each edge pixel in an image, an...