654 search results - page 98 / 131 » Linearity Testing in Characteristic Two |
SBCCI
2009
ACM
14 years 2 months ago
2009
ACM
The purpose of this work is the proposal of a 10-Bit / 1 MSPS Analog to Digital Converter (ADC) with error correction to match the requirements of a CMOS wavefront sensor for opht...
CVPR
2008
IEEE
14 years 2 months ago
2008
IEEE
In this paper, we address the problem of classifying image sets, each of which contains images belonging to the same class but covering large variations in, for instance, viewpoin...
IROS
2007
IEEE
14 years 1 months ago
2007
IEEE
— A new solution to the Simultaneous Localization and Modelling problem is presented. It is based on the stochastic search of solutions in the state space to the global localizat...
SMI
2006
IEEE
14 years 1 months ago
2006
IEEE
We discuss a shape representation based on a set of disconnected (planar) polygons. The polygons are computed by creating a BSP that contains approximately linear surface patches ...
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BROADNETS
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract— We explore network design principles for nextgeneration all-optical wide-area networks, employing light-trail technology. Light-trail [1] is a light-wave circuit that a...