980 search results - page 35 / 196 » Logical Testing |
DLOG
2007
13 years 10 months ago
2007
Abstract. The DL implementation group (DIG) has specified a common interface for description logic reasoner. While the original intention was to make it easier for other tools to ...
ETS
2011
IEEE
12 years 7 months ago
2011
IEEE
—In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional ...
DLOG
2003
13 years 9 months ago
2003
We present a translation of looping alternating two-way automata into a comparably inexpressive description logic, which is contained in SHIQ. This enables us to perform the empti...
VTS
2000
IEEE
13 years 12 months ago
2000
IEEE
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...