980 search results - page 6 / 196 » Logical Testing |
ITC
1995
IEEE
13 years 11 months ago
1995
IEEE
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
PTS
2010
13 years 5 months ago
2010
We present a novel algorithm for test data generation that is based on techniques used in formal software verification. Prominent examples of such formal techniques are symbolic ex...
FSTTCS
2005
Springer
14 years 1 months ago
2005
Springer
Abstract. We present a natural confluence of higher-order hereditary Harrop formulas (HH formulas), Constraint Logic Programming (CLP, [JL87]), and Concurrent Constraint Programmi...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
CSMR
2006
IEEE
14 years 1 months ago
2006
IEEE
When reengineering legacy systems, it is crucial to assess if the legacy behavior has been preserved or how it changed due to the reengineering effort. Ideally if a legacy system ...