89 search results - page 15 / 18 » Low Power Testing of VLSI Circuits: Problems and Solutions |
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
One of the main tasks in analog design is the sizing of the circuit parameters, such as transistor lengths and widths, in order to obtain optimal circuit performances, such as hig...
VLSID
2006
IEEE
14 years 1 months ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay has variability...
DELTA
2006
IEEE
14 years 1 months ago
2006
IEEE
In high speed digital circuits, the inductive effect is more dominant compared to capacitive effect. In particular, as the technology is shrinking, the spacing between interconnec...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
Abstract— Power consumption has become a crucial problem in modern circuit design. Multiple Supply Voltage (MSV) design is introduced to provide higher flexibility in controllin...