102 search results - page 2 / 21 » Low-Transition Test Pattern Generation for BIST-Based Applic... |
IJNSEC
2010
13 years 2 months ago
2010
Chaotic systems have many interesting features such as sensitivity on initial condition and system parameter, ergodicity and mixing properties. In this paper, we exploit these int...
TSE
2010
13 years 2 months ago
2010
Genetic algorithms (GAs) have been applied previously to UML-driven, stress test requirements generation with the aim of increasing chances of discovering faults relating to networ...
BMCBI
2010
13 years 4 months ago
2010
Background: The analysis of Inter-Alu PCR patterns obtained from human genomic DNA samples is a promising technique for a simultaneous analysis of many genomic loci flanked by Alu...
SERP
2007
13 years 8 months ago
2007
- Functional testing of software dedicated for hybrid embedded systems should start at the early development phase and requires analysis of discrete and continuous signals, where t...
VTS
1997
IEEE
13 years 11 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...