365 search results - page 13 / 73 » Maintaining the Ranch topology |
ICCAD
2007
IEEE
14 years 5 months ago
2007
IEEE
—As the 193nm lithography is likely to be used for 45nm and even 32nm processes, much more stringent requirement will be posed on Optical Proximity Correction (OPC) technologies....
ICCV
2005
IEEE
14 years 1 months ago
2005
IEEE
Active contour and active polygon models have been used widely for image segmentation. In some applications, the topology of the object(s) to be detected from an image is known a ...
IPSN
2004
Springer
14 years 1 months ago
2004
Springer
Topology management schemes conserve energy in wireless ad hoc networks by identifying redundant nodes that may turn off their radios or other components while maintaining connec...
TEI
2010
ACM
14 years 2 months ago
2010
ACM
In this paper, we describe a new method for camera-based fiducial tracking. Our new method is based on the combination of topological region adjacency and angle information, where...
SMA
2006
ACM
14 years 2 months ago
2006
ACM
Parametric and feature-based CAD models can be considered to represent families of similar objects. In current modelling systems, however, the semantics of such families are uncle...