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ECCV
2008
Springer
14 years 10 months ago
Passive Reflectometry
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although...
Fabiano Romeiro, Yuriy Vasilyev, Todd Zickler
ECCV
2004
Springer
14 years 10 months ago
Whitening for Photometric Comparison of Smooth Surfaces under Varying Illumination
We consider the problem of image comparison in order to match smooth surfaces under varying illumination. In a smooth surface nearby surface normals are highly correlated. We model...
Margarita Osadchy, Michael Lindenbaum, David W. Ja...
ECCV
2002
Springer
14 years 10 months ago
Evaluating Image Segmentation Algorithms Using the Pareto Front
Image segmentation is the first stage of processing in many practical computer vision systems. While development of particular segmentation algorithms has attracted considerable re...
Mark Everingham, Henk L. Muller, Barry T. Thomas
IPMI
2005
Springer
14 years 9 months ago
Unified Statistical Approach to Cortical Thickness Analysis
This paper presents a unified image processing and analysis framework for cortical thickness in characterizing a clinical population. The emphasis is placed on the development of d...
Moo K. Chung, Steve Robbins, Alan C. Evans
ISBI
2008
IEEE
14 years 9 months ago
Convex analysis and separation of composite signals in DCE-MRI
Dynamic functional imaging promises powerful tools for the visualization and elucidation of important diseasecausing biological processes, where the pixels often represent a compo...
Li Chen, Tsung-Han Chan, Peter L. Choyke, Chong-Yu...