183 search results - page 6 / 37 » Measuring and modeling anisotropic reflection |
SCALESPACE
2009
Springer
14 years 1 months ago
2009
Springer
Matrix fields are important in many applications since they are the adequate means to describe anisotropic behaviour in image processing models and physical measurements. A promin...
CGVR
2006
13 years 8 months ago
2006
- The challenges in modeling 3-D objects using facets and surface patches are investigated, and enhancement over the Gouraud's and Phong's interpolative shading is presen...
ECCV
2008
Springer
14 years 8 months ago
2008
Springer
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although...
CORR
2008
Springer
13 years 6 months ago
2008
Springer
We develop a purely ordinal model for aggregation functionals for lattice valued functions, comprising as special cases quantiles, the Ky Fan metric and the Sugeno integral. For m...
MVA
1996
13 years 8 months ago
1996
In this paper, a method for extracting influences of specular reflection and shade from multiple color images is described. As regards extraction, the di-chromatic reflection mode...