183 search results - page 9 / 37 » Measuring and modeling anisotropic reflection |
ICPR
2000
IEEE
14 years 7 months ago
2000
IEEE
Micromachined picoliter vials in silicon dioxide with a typical depth of 6.0?m are filled with a liquid sample. Epiilluminated microscopic imaging during evaporation of the liquid...
CVPR
2004
IEEE
14 years 8 months ago
2004
IEEE
In this paper we are interested in the joint reconstruction of geometry and photometry of scenes with multiple moving objects from a collection of motion-blurred images. We make s...
3DIM
2001
IEEE
13 years 10 months ago
2001
IEEE
We present a complete data acquisition and processing chain for the reliable inspection of industrial parts considering anisotropic noise. Data acquisition is performed with a str...
ICIP
2004
IEEE
14 years 8 months ago
2004
IEEE
An objective no-reference measure is presented to assess fine-structure image/video quality. It was designed to measure image/video quality for video surveillance applications, es...
INFOCOM
2006
IEEE
14 years 22 days ago
2006
IEEE
— This paper presents our work in the context of the Adaptive Resource Management (ARM) internal research project at the University of Milano-Bicocca, Italy. The project addresse...