Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem...
Lide Zhang, Lan S. Bai, Robert P. Dick, Li Shang, ...
In the past few years, Rapid Thermal Processes (RTP) have gained acceptance as mainstream technology for semi-conductors manufacturing. These processes are characterized by a sing...
An analogue testing standard IEEE 1149.4 is mainly targeted for low-frequency testing. The problem studied in this paper is extending the standard also for radio frequency testing...
We have developed a system architecture, measuring and modeling techniques, and algorithms for on-line power and energy optimization and thermal management. The starting point for...
Many scientific, financial, data mining and sensor network applications need to work with continuous, rather than discrete data e.g., temperature as a function of location, or sto...