- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
Jerry M. Soden, R. Keith Treece, Michael R. Taylor...
The practice of image processing inherently requires software development. Creating this technology requires designing, implementing, debugging and testing software applications o...
The efficient and effective generation of test-data from high-level models is of crucial importance in advanced modern software engineering. Empirical studies have shown that muta...
This paper describes a study performed in an industrial setting that attempts to build predictive models to identify parts of a Java system with a high probability of fault. The s...
Abstract--Real-time embedded systems (RTESs) are becoming increasingly ubiquitous, controlling a wide variety of popular and safety-critical devices. Effective testing techniques c...