Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
Venkataraman Mahalingam, N. Ranganathan, J. E. Har...
With continued scaling into the sub-90nm regime, the role of process, voltage and temperature (PVT) variations on the performance of VLSI circuits has become extremely important. T...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...
Abstract-- In distributed wireless networks without centralized control, each user is its own authority to maximize its own performance. This distributed characteristic provides th...
With the capability of supporting very high data rate services in a short range, Ultra-Wideband (UWB) technology is appealing to multimedia applications in future wireless personal...