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MMM
2005
Springer
152views Multimedia» more  MMM 2005»
14 years 3 months ago
Learning No-Reference Quality Metric by Examples
In this paper, a novel learning based method is proposed for No-Reference image quality assessment. Instead of examining the exact prior knowledge for the given type of distortion...
Hanghang Tong, Mingjing Li, HongJiang Zhang, Chang...
ALT
2003
Springer
14 years 1 months ago
Efficiently Learning the Metric with Side-Information
Abstract. A crucial problem in machine learning is to choose an appropriate representation of data, in a way that emphasizes the relations we are interested in. In many cases this ...
Tijl De Bie, Michinari Momma, Nello Cristianini
JMLR
2012
12 years 11 days ago
A metric learning perspective of SVM: on the relation of LMNN and SVM
Support Vector Machines, SVMs, and the Large Margin Nearest Neighbor algorithm, LMNN, are two very popular learning algorithms with quite different learning biases. In this paper...
Huyen Do, Alexandros Kalousis, Jun Wang, Adam Wozn...
PR
2010
186views more  PR 2010»
13 years 8 months ago
Feature extraction by learning Lorentzian metric tensor and its extensions
We develop a supervised dimensionality reduction method, called Lorentzian Discriminant Projection (LDP), for feature extraction and classification. Our method represents the str...
Risheng Liu, Zhouchen Lin, Zhixun Su, Kewei Tang
TKDE
2011
479views more  TKDE 2011»
13 years 4 months ago
Learning Semi-Riemannian Metrics for Semisupervised Feature Extraction
—Discriminant feature extraction plays a central role in pattern recognition and classification. Linear Discriminant Analysis (LDA) is a traditional algorithm for supervised feat...
Wei Zhang, Zhouchen Lin, Xiaoou Tang