This work presents and evaluates a novel processor microarchitecture which combines two paradigms: access/ execute decoupling and simultaneous multithreading. We investigate how b...
The impact of technology scaling on three run-time leakage reduction techniques (Input Vector Control, Body Bias Control and Power Supply Gating) is evaluated by determining limit...
Yuh-Fang Tsai, David Duarte, Narayanan Vijaykrishn...
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
This paper re-examines the well established clocking principles of pipelines. It is observed that clock gating techniques that have long been assumed optimal in reality produce a ...
Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
Ke Meng, Frank Huebbers, Russ Joseph, Yehea I. Ism...