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» Model Based Testing with Labelled Transition Systems
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127
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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 6 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
148
Voted
AVBPA
2003
Springer
172views Biometrics» more  AVBPA 2003»
15 years 7 months ago
Constraint Shape Model Using Edge Constraint and Gabor Wavelet Based Search
: Constraint Shape Model is proposed to extract facial feature using two different search methods for contour points and control points individually. In the proposed algorithm, sal...
Baochang Zhang, Wen Gao, Shiguang Shan, Wei Wang
130
Voted
EMMCVPR
2009
Springer
15 years 9 months ago
Clustering-Based Construction of Hidden Markov Models for Generative Kernels
Generative kernels represent theoretically grounded tools able to increase the capabilities of generative classification through a discriminative setting. Fisher Kernel is the fi...
Manuele Bicego, Marco Cristani, Vittorio Murino, E...
CP
2009
Springer
16 years 3 months ago
Constraint-Based Optimal Testing Using DNNF Graphs
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...
Anika Schumann, Martin Sachenbacher, Jinbo Huang
124
Voted
JSW
2008
104views more  JSW 2008»
15 years 2 months ago
Testing Software Assets of Framework-Based Product Families During Application Engineering Stage
An application framework provides reusable design and implementation for a family of software systems. At the application engineering stage, application developers extend framework...
Jehad Al-Dallal, Paul G. Sorenson