2 search results - page 1 / 1 » Model Checker Aided Design of a Controller for a Wafer Scann... |
ISOLA
2004
Springer
14 years 26 days ago
2004
Springer
SPIN
2000
Springer
13 years 11 months ago
2000
Springer
Abstract. We report on the use of model checking techniques for both the verification of a process control program and the derivation of optimal control schedules. Most of this wor...