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CODES
2010
IEEE
13 years 8 months ago
Statistical approach in a system level methodology to deal with process variation
The impact of process variation in state of the art technology makes traditional (worst case) designs unnecessarily pessimistic, which translates to suboptimal designs in terms of...
Concepción Sanz Pineda, Manuel Prieto, Jos&...
SIGMOD
2011
ACM
241views Database» more  SIGMOD 2011»
13 years 28 days ago
Neighborhood based fast graph search in large networks
Complex social and information network search becomes important with a variety of applications. In the core of these applications, lies a common and critical problem: Given a labe...
Arijit Khan, Nan Li, Xifeng Yan, Ziyu Guan, Supriy...
DSD
2002
IEEE
96views Hardware» more  DSD 2002»
14 years 3 months ago
Networks on Silicon: Blessing or Nightmare?
Continuing VLSI technology scaling raises several deep submicron (DSM) problems like relatively slow interconnect, power dissipation and distribution, and signal integrity. Those ...
Paul Wielage, Kees G. W. Goossens