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ICST
2009
IEEE
13 years 6 months ago
A Flexible Framework for Quality Assurance of Software Artefacts with Applications to Java, UML, and TTCN-3 Test Specifications
Manual reviews and inspections of software artefacts are time consuming and thus, automated analysis tools have been developed to support the quality assurance of software artefac...
Jens Nodler, Helmut Neukirchen, Jens Grabowski
ICIP
2010
IEEE
13 years 6 months ago
Entropies and cross-entropies of exponential families
Statistical modeling of images plays a crucial role in modern image processing tasks like segmentation, object detection and restoration. Although Gaussian distributions are conve...
Frank Nielsen, Richard Nock
AI
2010
Springer
13 years 3 months ago
Robustness of Classifiers to Changing Environments
Abstract. In this paper, we test some of the most commonly used classifiers to identify which ones are the most robust to changing environments. The environment may change over tim...
Houman Abbasian, Chris Drummond, Nathalie Japkowic...
JMLR
2010
152views more  JMLR 2010»
13 years 3 months ago
The SHOGUN Machine Learning Toolbox
We have developed a machine learning toolbox, called SHOGUN, which is designed for unified large-scale learning for a broad range of feature types and learning settings. It offers...
Sören Sonnenburg, Gunnar Rätsch, Sebasti...
JMLR
2010
145views more  JMLR 2010»
13 years 3 months ago
Parallelizable Sampling of Markov Random Fields
Markov Random Fields (MRFs) are an important class of probabilistic models which are used for density estimation, classification, denoising, and for constructing Deep Belief Netwo...
James Martens, Ilya Sutskever