223 search results - page 30 / 45 » New methods and coverage metrics for functional verification |
CVPR
2009
IEEE
15 years 3 months ago
2009
IEEE
In this paper, we introduce a novel algorithm to solve
global shape registration problems. We use gray-scale “images”
to represent source shapes, and propose a novel twocompo...
ASPDAC
2008
ACM
13 years 10 months ago
2008
ACM
Scaling is currently the most popular technique used to improve performance metrics of CMOS circuits. This cannot go on forever because the properties that are responsible for the ...
FLAIRS
2009
13 years 6 months ago
2009
This paper introduces an information theoretic approach to verification of modular causal probabilistic models. We assume systems which are gradually extended by adding new functi...
GECCO
2006
Springer
14 years 11 days ago
2006
Springer
In this paper, an object-oriented unified optimization framework (UOF) for general problem optimization is proposed. Based on evolutionary algorithms, numerical deterministic meth...
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
The Boolean satisfiability problem (SAT) has various applications in electronic design automation (EDA) fields such as testing, timing analysis and logic verification. SAT has bee...