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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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CP
2009
Springer
14 years 9 months ago
Constraint-Based Optimal Testing Using DNNF Graphs
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...
Anika Schumann, Martin Sachenbacher, Jinbo Huang
ISSRE
2008
IEEE
14 years 3 months ago
Testing Software Product Lines Using Incremental Test Generation
We present a novel specification-based approach for generating tests for products in a software product line. Given properties of features as first-order logic formulas, our app...
Engin Uzuncaova, Daniel Garcia, Sarfraz Khurshid, ...
COMPSAC
2006
IEEE
14 years 3 months ago
Backtracking Algorithms and Search Heuristics to Generate Test Suites for Combinatorial Testing
Combinatorial covering arrays have been used in several testing approaches. This paper first discusses some existing methods for finding such arrays. Then a SAT-based approach a...
Jun Yan, Jian Zhang
ITC
1996
IEEE
98views Hardware» more  ITC 1996»
14 years 1 months ago
Mixed-Mode BIST Using Embedded Processors
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
Sybille Hellebrand, Hans-Joachim Wunderlich, Andre...
ASPDAC
2006
ACM
119views Hardware» more  ASPDAC 2006»
14 years 3 months ago
A dynamic test compaction procedure for high-quality path delay testing
- We propose a dynamic test compaction procedure to generate high-quality test patterns for path delay faults. While the proposed procedure generates a compact two-pattern test set...
Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, T...