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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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KBSE
2002
IEEE
14 years 2 months ago
Generating Test Data for Functions with Pointer Inputs
Generating test inputs for a path in a function with integer and real parameters is an important but difficult problem. The problem becomes more difficult when pointers are pass...
Srinivas Visvanathan, Neelam Gupta
KBSE
2008
IEEE
14 years 3 months ago
Query-Aware Test Generation Using a Relational Constraint Solver
We present a novel approach for black-box testing of database management systems (DBMS) using the Alloy tool-set. Given a database schema and an SQL query as inputs, our approach ...
Shadi Abdul Khalek, Bassem Elkarablieh, Yai O. Lal...
SIGSOFT
2007
ACM
14 years 9 months ago
Improving test case generation for web applications using automated interface discovery
With the growing complexity of web applications, identifying web interfaces that can be used for testing such applications has become increasingly challenging. Many techniques tha...
William G. J. Halfond, Alessandro Orso
ICST
2009
IEEE
14 years 3 months ago
Test Input Generation Using UML Sequence and State Machines Models
We propose a novel testing approach that combines information from UML sequence models and state machine models. Current approaches that rely solely on sequence models do not cons...
Aritra Bandyopadhyay, Sudipto Ghosh
MTV
2005
IEEE
138views Hardware» more  MTV 2005»
14 years 2 months ago
Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
Paolo Bernardi, Ernesto Sánchez, Massimilia...