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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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ERSA
2010
159views Hardware» more  ERSA 2010»
15 years 3 months ago
Acceleration of FPGA Fault Injection Through Multi-Bit Testing
SRAM-based FPGA devices are an attractive option for data processing on space-based platforms, due to high computational capabilities and a lower power envelope than traditional pr...
Grzegorz Cieslewski, Alan D. George, Adam Jacobs
JSS
2002
101views more  JSS 2002»
15 years 5 months ago
Software requirements validation via task analysis
As a baseline for software development, a correct and complete requirements definition is one foundation of software quality. Previously, a novel approach to static testing of sof...
Hong Zhu, Lingzi Jin, Dan Diaper, Ganghong Bai
DAC
2000
ACM
16 years 6 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
COR
2008
103views more  COR 2008»
15 years 5 months ago
A tabu search algorithm for structural software testing
This paper presents a tabu search metaheuristic algorithm for the automatic generation of structural software tests. It is a novel work since tabu search is applied to the automat...
Eugenia Díaz, Javier Tuya, Raquel Blanco, J...
ICSE
2010
IEEE-ACM
15 years 10 months ago
Test generation through programming in UDITA
We present an approach for describing tests using nondeterministic test generation programs. To write such programs, we introduce UDITA, a Java-based language with non-determinist...
Milos Gligoric, Tihomir Gvero, Vilas Jagannath, Sa...