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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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ERSA
2010
159views Hardware» more  ERSA 2010»
13 years 7 months ago
Acceleration of FPGA Fault Injection Through Multi-Bit Testing
SRAM-based FPGA devices are an attractive option for data processing on space-based platforms, due to high computational capabilities and a lower power envelope than traditional pr...
Grzegorz Cieslewski, Alan D. George, Adam Jacobs
JSS
2002
101views more  JSS 2002»
13 years 8 months ago
Software requirements validation via task analysis
As a baseline for software development, a correct and complete requirements definition is one foundation of software quality. Previously, a novel approach to static testing of sof...
Hong Zhu, Lingzi Jin, Dan Diaper, Ganghong Bai
DAC
2000
ACM
14 years 10 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
COR
2008
103views more  COR 2008»
13 years 9 months ago
A tabu search algorithm for structural software testing
This paper presents a tabu search metaheuristic algorithm for the automatic generation of structural software tests. It is a novel work since tabu search is applied to the automat...
Eugenia Díaz, Javier Tuya, Raquel Blanco, J...
ICSE
2010
IEEE-ACM
14 years 1 months ago
Test generation through programming in UDITA
We present an approach for describing tests using nondeterministic test generation programs. To write such programs, we introduce UDITA, a Java-based language with non-determinist...
Milos Gligoric, Tihomir Gvero, Vilas Jagannath, Sa...