: While the common kinds of uncertainties in databases (e.g., null values, disjunction, corrupt/missing data, domain mismatch, etc.) have been extensively studied, a relatively une...
Current lithography techniques use a light wavelength of 193nm to print sub-65nm features. This introduces process variations which cause mismatches between desired and actual waf...
As XML data storage and interchange become ubiquitous, analysts and data engineers increasingly need tools to model their data and map it to XML schemas and to reverse engineer XML...
Reema Al-Kamha, David W. Embley, Stephen W. Liddle
One of the open problems listed in Rivest and Schapire, 1989] is whether and how that the copies of L in their algorithm can be combined into one for better performance. This pape...
We are interested in developing a better understanding of what it is that students find difficult in learning logic. We use both natural language and diagram-based methods for teac...
Richard Cox, Robert Dale, John Etchemendy, Dave Ba...