1721 search results - page 241 / 345 » On Active and Passive Testing |
137
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VLSID
2007
IEEE
16 years 5 months ago
2007
IEEE
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...
150
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ICSE
2005
IEEE-ACM
16 years 4 months ago
2005
IEEE-ACM
End users develop more software than any other group of programmers, using software authoring devices such as e-mail filtering editors, by-demonstration macro builders, and spread...
144
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SDM
2009
SIAM
16 years 1 months ago
2009
SIAM
Mining graph data is an active research area. Several data mining methods and algorithms have been proposed to identify structures from graphs; still, the evaluation of those resu...
125
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ICSE
2009
IEEE-ACM
15 years 11 months ago
2009
IEEE-ACM
We report on one organization's experience making process changes in a suite of projects. The changes were motivated by clients’ requests for better time estimates, better ...
152
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COMPSAC
2008
IEEE
15 years 11 months ago
2008
IEEE
— In software testing and maintenance activities, the observed faults and bugs are reported in bug report managing systems (BRMS) for further analysis and repair. According to th...