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» On Applying Set Covering Models to Test Set Compaction
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ICML
2006
IEEE
14 years 8 months ago
Feature value acquisition in testing: a sequential batch test algorithm
In medical diagnosis, doctors often have to order sets of medical tests in sequence in order to make an accurate diagnosis of patient diseases. While doing so they have to make a ...
Victor S. Sheng, Charles X. Ling
ET
1998
52views more  ET 1998»
13 years 7 months ago
Scalable Test Generators for High-Speed Datapath Circuits
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
Hussain Al-Asaad, John P. Hayes, Brian T. Murray
EJIS
2007
139views more  EJIS 2007»
13 years 7 months ago
Applying TAM across cultures: the need for caution
The technology acceptance model (TAM) is one of the most widely used behavioural models in the information systems (IS) field. Researchers have used the model to study many differ...
Scott McCoy, Dennis F. Galletta, William R. King
PR
2006
84views more  PR 2006»
13 years 7 months ago
Clustering techniques for protein surfaces
Though most approaches to protein comparison are based on their structure, several studies produced evidence of a strict correlation between the surface characteristics of protein...
Lorenzo Baldacci, Matteo Golfarelli, Alessandra Lu...
ET
2002
72views more  ET 2002»
13 years 7 months ago
Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor
Abstract. A novel approach for using an embedded processor to aid in deterministic testing of the other components of a system-on-a-chip (SOC) is presented. The tester loads a prog...
Abhijit Jas, Nur A. Touba