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» On Applying Set Covering Models to Test Set Compaction
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ICST
2010
IEEE
13 years 6 months ago
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit ...
ENTCS
2010
99views more  ENTCS 2010»
13 years 7 months ago
State Based Robustness Testing for Components
Component based development allows to build software upon existing components and promises to improve software reuse and reduce costs. To gain reliability of a component based sys...
Bin Lei, Zhiming Liu, Charles Morisset, Xuandong L...
FMICS
2006
Springer
13 years 11 months ago
Test Coverage for Loose Timing Annotations
Abstract. The design flow of systems-on-a-chip (SoCs) identifies several abstraction levels higher than the Register-Transfer-Level that constitutes the input of the synthesis tool...
Claude Helmstetter, Florence Maraninchi, Laurent M...
CVPR
2009
IEEE
14 years 2 months ago
Manifold Discriminant Analysis
This paper presents a novel discriminative learning method, called Manifold Discriminant Analysis (MDA), to solve the problem of image set classification. By modeling each image s...
Ruiping Wang, Xilin Chen
ICST
2010
IEEE
13 years 6 months ago
Repairing GUI Test Suites Using a Genetic Algorithm
—Recent advances in automated functional testing of Graphical User Interfaces (GUIs) rely on deriving graph models that approximate all possible sequences of events that may be e...
Si Huang, Myra B. Cohen, Atif M. Memon