1256 search results - page 44 / 252 » On Combining Classifiers |
ICIP
1998
IEEE
14 years 11 months ago
1998
IEEE
A novel method for extracting parametric junction and corner features in images is presented. By treating each complex feature as a combination of elementary line and edge feature...
ICPR
2004
IEEE
14 years 11 months ago
2004
IEEE
For the tasks of classification, two types of patterns can generate problems: ambiguous patterns and outliers. Furthermore, it is possible to separate classification algorithms in...
ICCV
2009
IEEE
15 years 3 months ago
2009
IEEE
In this paper we present a combined approach for ob-
ject localization and classification. Our contribution is two-
fold. (a) A contextual combination of localization and clas-
...
ISBI
2006
IEEE
14 years 11 months ago
2006
IEEE
We propose an algorithm for the classification of fluorescence microscopy images depicting the spatial distribution of proteins within the cell. The problem is at the forefront of...
CVPR
2001
IEEE
15 years 9 days ago
2001
IEEE
We present a two-step method to speed-up object detection systems in computer vision that use Support Vector Machines (SVMs) as classifiers. In a first step we perform feature red...