In this paper, we focus on reliability, one of the most fundamental and important challenges, in the nanoelectronics environment. For a processor architecture based on the unreliab...
Abstract--The development of the transformer insulation failure undergoes three stages: insulation aging, incipient faults and a short circuit. This paper presents a complete schem...
— Most state-based approaches to fault diagnosis of discrete-event systems require a complete and accurate model of the system to be diagnosed. In this paper, we address the prob...
— Large Clusters, high availability clusters and Grid deployments often suffer from network, node or operating system faults and thus require the use of fault tolerant programmin...
Black-box testing is a popular technique for assessing the quality of a system. However, in case of a test failure, only little information is available to identify the root-cause ...