1187 search results - page 54 / 238 » On Modeling Cross-Talk Faults |
ET
2007
13 years 8 months ago
2007
In this paper, we focus on reliability, one of the most fundamental and important challenges, in the nanoelectronics environment. For a processor architecture based on the unreliab...
ENGL
2008
13 years 8 months ago
2008
Abstract--The development of the transformer insulation failure undergoes three stages: insulation aging, incipient faults and a short circuit. This paper presents a complete schem...
TSMC
2011
13 years 3 months ago
2011
— Most state-based approaches to fault diagnosis of discrete-event systems require a complete and accurate model of the system to be diagnosed. In this paper, we address the prob...
CLUSTER
2003
IEEE
14 years 2 months ago
2003
IEEE
— Large Clusters, high availability clusters and Grid deployments often suffer from network, node or operating system faults and thus require the use of fault tolerant programmin...
PTS
2007
13 years 10 months ago
2007
Black-box testing is a popular technique for assessing the quality of a system. However, in case of a test failure, only little information is available to identify the root-cause ...