1461 search results - page 160 / 293 » On Regular Reduced Products |
JSW
2008
13 years 9 months ago
2008
The MURA phenomenon will result lots of problems in Photomask and TFT-LCD industries as well. In this paper, we designed and developed a MURA related association rules which suitab...
JOT
2006
13 years 9 months ago
2006
Software reuse is commonly used to leverage existing assets and to reduce development cost and time. Reuse can be accomplished by several different mechanisms. This paper describe...
EOR
2007
13 years 9 months ago
2007
: New semiconductor wafer fabrication facilities use Front Opening Unified Pods (FOUPs) as a common unit of wafer transfer. Since the number of pods is limited due to high costs, a...
PAMI
2006
13 years 9 months ago
2006
In an errors-in-variables (EIV) model, all the measurements are corrupted by noise. The class of EIV models with constraints separable into the product of two nonlinear functions, ...
IJMC
2007
13 years 9 months ago
2007
: The paper deals with wireless data services and their importance in the enterprise world. Provisioning in difficult-to-reach areas of tall buildings is challenging. To extend cov...