34 search results - page 5 / 7 » On test conditions for the detection of open defects |
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
Analysis of IC technology trends indicates that Iddq testing may be approaching its limits of applicability. The new concept of the current signature may expand this limit under t...
MICCAI
2004
Springer
14 years 8 months ago
2004
Springer
The MicroTactus is a family of instruments that we have designed to detect signals arising from the interaction of a tip with soft or hard objects and to magnify them for haptic an...
VTS
2002
IEEE
14 years 9 days ago
2002
IEEE
Very Low Voltage (VLV) testing has been proposed to increase flaw detection in bulk silicon CMOS integrated circuits and this paper explores these and additional advantages in the...
JCIT
2010
13 years 2 months ago
2010
Sensor deployment is a critical issue, as it affects the cost and detection capabilities of a wireless sensor network. Although many previous efforts have addressed this issue, mo...
WCRE
2003
IEEE
14 years 19 days ago
2003
IEEE
Graphical user interfaces (GUIs) are important parts of today’s software and their correct execution is required to ensure the correctness of the overall software. A popular tec...